[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa...

  • Main
  • [IEEE 2009 27th IEEE VLSI Test...

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths

Ma, Junxia, Lee, Jeremy, Tehranipoor, Mohammad
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/vts.2009.45
File:
PDF, 737 KB
english, 2009
Conversion to is in progress
Conversion to is failed