[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths
Ma, Junxia, Lee, Jeremy, Tehranipoor, MohammadYear:
2009
Language:
english
DOI:
10.1109/vts.2009.45
File:
PDF, 737 KB
english, 2009