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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - Design and characterization of a post-processed copper heat sink for smart power drivers [lateral nDMOS drivers]
Van den bosch, G., Webers, T., Driessens, E., Elattari, B., Wojciechowski, D., Gassot, P., Moens, P., Groeseneken, G.Year:
2005
Language:
english
DOI:
10.1109/icmts.2005.1452210
File:
PDF, 781 KB
english, 2005