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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Detecting stability faults in sub-threshold SRAMs
Lin, Chen-Wei, Yang, Hao-Yu, Huang, Chin-Yuan, Chen, Hung-Hsin, Chao, Mango C.-T.Year:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105301
File:
PDF, 481 KB
english, 2011