[IEEE 2002 IEEE 18th International Semiconductor Laser Conference. Conference Digest - Garmisch, Germany (29 Sept.-3 Oct. 2002)] IEEE 18th International Semiconductor Laser Conference - High brightness tapered lasers at 732 nm and 975 nm: experiments and numerical analysis
Borruel, L., Sujecki, S., Auzanneau, S.C., Sumpf, B., Moreno, P., Wykes, J., Krakowski, M., Erbert, G., Rodriguez, D., Sewell, P., Calligaro, M., Wenzel, H., Benson, T.M., Larkins, E.C., Esquivias, I.Year:
2002
Language:
english
DOI:
10.1109/islc.2002.1041132
File:
PDF, 148 KB
english, 2002