[IEEE 2008 IEEE International Test Conference - Santa...

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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Embedded Testing in an In-Circuit Test Environment

Malian, J., Eklow, B.
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Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700652
File:
PDF, 347 KB
english, 2008
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