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[IEEE 2006 International Workshop on Junction Technology - Shanghai, China ()] 2006 International Workshop on Junction Technology - Elimination of Floating body Effect and Thermal Instability in a Nano Quasi-SOI MOSFET with π-shaped Semiconductor Layer

Jyi-Tsong Lin,, Yi-Chuen Eng,, Tai-Yi Lee,, Kao-Cheng Lin,

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Year:

2006

Language:

english

DOI:

10.1109/iwjt.2006.220898

File:

PDF, 3.54 MB

english, 2006

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[IEEE 2006 International Workshop on Junction Technology -...

[IEEE 2006 International Workshop on Junction Technology - Shanghai, China ()] 2006 International Workshop on Junction Technology - Elimination of Floating body Effect and Thermal Instability in a Nano Quasi-SOI MOSFET with &#960;-shaped Semiconductor Layer

[IEEE 2006 International Workshop on Junction Technology - Shanghai, China ()] 2006 International Workshop on Junction Technology - Elimination of Floating body Effect and Thermal Instability in a Nano Quasi-SOI MOSFET with π-shaped Semiconductor Layer