[ACM 33rd Design Automation Conference - Las Vegas, NV, USA (3-7 June 1996)] 33rd Design Automation Conference Proceedings, 1996 - iCET: a complete chip-level thermal reliability diagnosis tool for CMOS VLSI chips
Yi-Kan Cheng,, Chin-Chi Teng,, Dharchoudhury, A., Rosenbaum, E., Sung-Mo Kang,Year:
1996
Language:
english
DOI:
10.1109/dac.1996.545636
File:
PDF, 524 KB
english, 1996