Structure of (Ta2O5)x(SiO2)1 − x xerogels (x = 0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, 29Si and 17O MAS NMR and EXAFS
Pickup, David M., Mountjoy, Gavin, Holland, Mark A., Wallidge, Graham W., Newport, Robert J., Smith, Mark E.Volume:
10
Year:
2000
Language:
english
Journal:
Journal of Materials Chemistry
DOI:
10.1039/b000947o
File:
PDF, 174 KB
english, 2000