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[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - RMS and average errors resulting from low pass filter characteristics in instrumentation systems
Destefan, D.Year:
1989
Language:
english
DOI:
10.1109/imtc.1989.36823
File:
PDF, 326 KB
english, 1989