[IEEE 2008 23rd IEEE International Symposium on Defect and...

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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis

Wang, Xiaoxiao, Salmani, Hassan, Tehranipoor, Mohammad, Plusquellic, Jim
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Year:
2008
Language:
english
DOI:
10.1109/dft.2008.61
File:
PDF, 391 KB
english, 2008
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