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[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Variational Interconnect Delay Metrics for Statistical Timing Analysis

Ghanta, P., Vrudhula, S.
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Year:
2006
Language:
english
DOI:
10.1109/isqed.2006.143
File:
PDF, 230 KB
english, 2006
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