![](/img/cover-not-exists.png)
[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Variational Interconnect Delay Metrics for Statistical Timing Analysis
Ghanta, P., Vrudhula, S.Year:
2006
Language:
english
DOI:
10.1109/isqed.2006.143
File:
PDF, 230 KB
english, 2006