[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh,...

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[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - A BIST method for TSVs pre-bond test

Zimouche, Hakim, Di Natale, Giorgio, Flottes, Marie-lise, Rouzeyre, Bruno
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Year:
2013
Language:
english
DOI:
10.1109/idt.2013.6727081
File:
PDF, 1.54 MB
english, 2013
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