[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - A BIST method for TSVs pre-bond test
Zimouche, Hakim, Di Natale, Giorgio, Flottes, Marie-lise, Rouzeyre, BrunoYear:
2013
Language:
english
DOI:
10.1109/idt.2013.6727081
File:
PDF, 1.54 MB
english, 2013