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[IEEE 2010 Annual Reliability and Maintainability Symposium (RAMS) - San Jose, CA, USA (2010.01.25-2010.01.28)] 2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) - Reliability test procedures for achieving highly robust electronic products
Tekcan, Tarkan, Kirisken, BarbarosYear:
2010
Language:
english
DOI:
10.1109/rams.2010.5447982
File:
PDF, 267 KB
english, 2010