[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - A summary of recent VLSI SEU and latch-up testing (for space application)
Kinnison, J.D., Maurer, R.H., McKerracher, P.L., Carkhuff, B.G.Year:
1992
Language:
english
DOI:
10.1109/redw.1992.247331
File:
PDF, 330 KB
english, 1992