[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Fast test pattern generation for all path delay faults considering various test classes
Fuchs, K., Wittmann, H.C., Antreich, K.J.Year:
1993
Language:
english
DOI:
10.1109/etc.1993.246529
File:
PDF, 857 KB
english, 1993