[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Analysis of GaAs HBT failure mechanisms: impact on life test strategy
Maneux, C., Labat, N., Saysset, N., Touboul, A., Danto, Y., Dumas, J.-M., Launay, P., Dangla, J.Year:
1997
Language:
english
DOI:
10.1109/ipfa.1997.638194
File:
PDF, 519 KB
english, 1997