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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Compensation of surface inclination for detecting in optical triangulation sensors

Kyung-Chan Kim,, Se-Baek Oh,, Jong-Ahn Kim,, Soohyun Kim,, Yoon Keun Kwak,
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Volume:
3
Year:
2000
Language:
english
DOI:
10.1109/imtc.2000.848684
File:
PDF, 345 KB
english, 2000
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