[IEEE Semiconducting and Semi-Insulating Materials Conference - Toulouse, France (29 April-3 May 1996)] Proceedings of Semiconducting and Semi-Insulating Materials Conference - Deep trap characterization of Al./sub 48/In./sub 52/As/In/sub .52/(Ga/sub .7/Al/sub .3/)/sub .48/As heterostructures
Rezzoug, K., Ducroquet, F., Guillot, G., Giraudet, L., Praseuth, J.P.Year:
1996
Language:
english
DOI:
10.1109/sim.1996.571102
File:
PDF, 261 KB
english, 1996