Sulfur-induced offsets in MC-ICP-MS silicon-isotope...

Journal of Analytical Atomic Spectrometry 2009 Vol. 24; Iss. 8

Sulfur-induced offsets in MC-ICP-MS silicon-isotope measurements

van den Boorn, Sander H. J. M., Vroon, Pieter Z., van Bergen, Manfred J.
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Volume:
24
Year:
2009
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/b816804k
File:
PDF, 202 KB
english, 2009
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