X-ray diffraction, transmission electron microscopy and...

X-ray diffraction, transmission electron microscopy and X-ray photoelectron spectroscopic characterization of IrO2+ Ta2O5 films

Roginskaya, Yu. E., Morozova, O. V., Loubnin, E. N., Popov, A. V., Ulitina, Yu. I., Zhurov, V. V., Ivanov, S. A., Trasatti, S.
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Volume:
89
Year:
1993
Language:
english
Journal:
Journal of the Chemical Society, Faraday Transactions
DOI:
10.1039/ft9938901707
File:
PDF, 1.83 MB
english, 1993
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