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[IEEE Conference Digest. 15th IEEE International Semiconductor Laser Conference - Haifa, Israel (13-18 Oct. 1996)] Conference Digest. 15th IEEE International Semiconductor Laser Conference - Reliability of 680-nm window laser diodes at 50-100 mW CW operation
Shima, A., Tada, H., Utakouji, T., Motoda, T., Tsugami, M., Higuchi, H., Aiga, M.Year:
1996
Language:
english
DOI:
10.1109/islc.1996.558766
File:
PDF, 161 KB
english, 1996