[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - A 1/3" progressive scan 1280(H)×960(V) FT-CCD for digital still camera applications
Bosiers, J.T., Beorsma, Y.A., Kleimann, A.C., Verbugt, D.W., Peek, H.L., van der Sijde, A.G.Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.650306
File:
PDF, 732 KB
english, 1997