[IEEE 2010 IEEE 19th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Austin, TX, USA (2010.10.25-2010.10.27)] 19th Topical Meeting on Electrical Performance of Electronic Packaging and Systems - Investigating substrate coupling noise impact on low-power memory controller PHY interface using on-chip measurement structure
Lan, Hai, Aleksic, Marko, Schmitt, Ralf, Nguyen, Nhat, Yuan, ChuckYear:
2010
Language:
english
DOI:
10.1109/epeps.2010.5642565
File:
PDF, 1013 KB
english, 2010