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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues
Bayraktaroglu, Ismet, Hunt, Jim, Watkins, DanielYear:
2006
Language:
english
DOI:
10.1109/test.2006.297675
File:
PDF, 249 KB
english, 2006