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[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Limitations on oxide thicknesses in flash EEPROM applications
Runnion, E.F., Gladstone, S.M., Scott, R.S., Dumin, D.J., Lie, L., Mitros, J.Year:
1996
Language:
english
DOI:
10.1109/relphy.1996.492066
File:
PDF, 718 KB
english, 1996