[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Analysis of charge storage in the base of bipolar transistors and its influence on the parasitic resistance adopting an eight terminal Kelvin test structure
Asti, S., Cavioni, T., Neviani, A., Pavan, P., Stival, M., Vendrame, L., Zanoni, E.Year:
1996
Language:
english
DOI:
10.1109/icmts.1996.535627
File:
PDF, 476 KB
english, 1996