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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Abnormal ESD failure mode with low-voltage turn-on phenomenon of LDMOS output driver
Park, Jaeyoung, Orshansky, MichaelYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241891
File:
PDF, 489 KB
english, 2012