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[IEEE 2011 IEEE/SICE International Symposium on System Integration (SII 2011) - Kyoto, Japan (2011.12.20-2011.12.22)] 2011 IEEE/SICE International Symposium on System Integration (SII) - Pretest gap mura on TFT LCDs using the interference pattern method
Rong-Seng Chang,, Jang-Zern Tsai,, Tung-Yen Li,, Li-Wei Ho,, Ching-Fu Yang,Year:
2011
Language:
english
DOI:
10.1109/sii.2011.6147419
File:
PDF, 574 KB
english, 2011