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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Improved Handling of False and Multicycle Paths in ATPG
Vorisek, V., Swanson, B., Kun-Han Tsai,, Goswami, D.Year:
2006
Language:
english
DOI:
10.1109/vts.2006.38
File:
PDF, 323 KB
english, 2006