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[IEEE 2010 Annual Reliability and Maintainability Symposium (RAMS) - San Jose, CA, USA (2010.01.25-2010.01.28)] 2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) - Using risk assessment to mitigate new business demands uncertainties
Scapin, Carlos Alberto, Gomes, Luciano de Alencar MirandaYear:
2010
Language:
english
DOI:
10.1109/rams.2010.5447974
File:
PDF, 1.02 MB
english, 2010