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[IEEE 2007 Spanish Conference on Electron Devices - Madrid, Spain (2007.01.31-2007.02.2)] 2007 Spanish Conference on Electron Devices - Analysis of the impact of intrinsic parameter fluctuations in a 50 nm InP HEMT
Seoane, Natalia, Garcia-Loureiro, Antonio, Kalna, Karol, Asenov, AsenYear:
2007
Language:
english
DOI:
10.1109/sced.2007.384001
File:
PDF, 1.74 MB
english, 2007