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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Introduction to fault attacks on smartcard
Lemarechal, A.Year:
2005
DOI:
10.1109/iolts.2005.39
File:
PDF, 36 KB
2005