[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Fmax enhancement of dynamic threshold-voltage MOSFET (DTMOS) under ultra-low supply voltage
Tanaka, T., Momiyama, Y., Sugii, T.Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.650415
File:
PDF, 299 KB
english, 1997