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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Investigation of multi cell upset in sequential logic and validity of redundancy technique
Uemura, Taiki, Kato, Takashi, Matsuyama, Hideya, Takahisa, Keiji, Fukuda, Mitsuhiro, Hatanaka, KichijiYear:
2011
Language:
english
DOI:
10.1109/iolts.2011.5993803
File:
PDF, 358 KB
english, 2011