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[IEEE 2000 IEEE Ultrasonics Symposium. Proceedings. An International Symposium - San Juan, Puerto Rico (22-25 Oct. 2000)] 2000 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.00CH37121) - Modeling and measurement of cryogel elasticity properties for calibrating of IVUS elasticity images
Fromageau, J., Delachartre, P., Boyer, J.C., El Guerjouma, R., Gimenez, G.Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/ultsym.2000.921677
File:
PDF, 415 KB
english, 2000