[IEEE 2008 IEEE International Conference on Microelectronic...

  • Main
  • [IEEE 2008 IEEE International...

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Characterization of MOSFETs intrinsic performance using in-wafer advanced Kelvin-contact device structure for high performance CMOS LSIs

Rihito Kuroda,, Akinobu Teramoto,, Takanori Komuro,, Weitao Cheng,, Syunichi Watabe,, Ching Foa Tye,, Shigetoshi Sugawa,, Tadahiro Ohmi,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
DOI:
10.1109/icmts.2008.4509331
File:
PDF, 371 KB
2008
Conversion to is in progress
Conversion to is failed