[IEEE 2012 13th International Conference on Ultimate...

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[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Device scaling model for bulk FinFETs

Medury, A., Mercha, K., Ritzenthaler, R., De Keersgieter, A., Chiarella, T., Collaert, N., Bhat, N., Bhat, K. N
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Year:
2012
Language:
english
Pages:
4
DOI:
10.1109/ulis.2012.6193370
File:
PDF, 535 KB
english, 2012
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