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[IEEE 2010 23rd International Vacuum Nanoelectronics Conference (IVNC) - Palo Alto, CA, USA (2010.07.26-2010.07.30)] International Vacuum Nanoelectronics Conference - P2–34: Study of field emission from various microstructures of graphene by using anode-probe equipped within scanning electron microscope
Du, Jiale, Deng, Shaozhi, Xu, Ningsheng, She, JuncongYear:
2010
Language:
english
DOI:
10.1109/ivnc.2010.5563132
File:
PDF, 395 KB
english, 2010