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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures
Banerjee, Aritra, Sen, Shreyas, Devarakond, Shyam Kumar, Chatterjee, AbhijitYear:
2011
Language:
english
DOI:
10.1109/vts.2011.5783755
File:
PDF, 1.23 MB
english, 2011