[IEEE 2012 25th International Vacuum Nanoelectronics Conference (IVNC) - Jeju, Korea (South) (2012.07.9-2012.07.13)] 25th International Vacuum Nanoelectronics Conference - The fundamental experiments x-ray imaging driven by electron beam
Neo, Yoichiro, Suzuki, Ryuji, Aoki, Toru, Mmimura, HidenoriYear:
2012
Language:
english
DOI:
10.1109/ivnc.2012.6316922
File:
PDF, 138 KB
english, 2012