[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - A voltage scaling model for performance evaluation in digital CMOS circuits
von Arnim, Klaus, Schruefer, Klaus, Baumann, Thomas, Hofmann, Karl, Schulz, Thomas, Pacha, Christian, Berthold, JoergYear:
2009
Language:
english
DOI:
10.1109/iedm.2009.5424310
File:
PDF, 572 KB
english, 2009