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Reminiscences of the VLSI Revolution: How a Series of Failures Triggered a Paradigm Shift in Digital Design
Conway, LynnVolume:
4
Language:
english
Journal:
IEEE Solid-State Circuits Magazine
DOI:
10.1109/mssc.2012.2215752
Date:
December, 2012
File:
PDF, 8.21 MB
english, 2012