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[IEEE Factory Automation (ETFA 2010) - Bilbao (2010.09.13-2010.09.16)] 2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010) - Comparison of mapping techniques in appearance-based topological maps creation
Rojo, Lorenzo Fernandez, Paya, L, Reinoso, O, Marin, J M, Gil, AYear:
2010
Language:
english
DOI:
10.1109/etfa.2010.5641203
File:
PDF, 1.70 MB
english, 2010