[IEEE [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference - Atlanta, GA, USA (14-16 May 1991)] [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference - A six-port reflectometer with a variable test port impedance suitable for nonlinear microwave device characterization
Ghannouchi, F.M., Bosisio, R.G.Year:
1991
Language:
english
DOI:
10.1109/imtc.1991.161571
File:
PDF, 238 KB
english, 1991