[IEEE Comput. Soc 10th IEEE International On-Line Testing...

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[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - Sizing CMOS circuits for increased transient error tolerance

Dhillon, Y.S., Diril, A.U., Chatterjee, A., Singh, A.D.
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Year:
2004
Language:
english
DOI:
10.1109/olt.2004.1319653
File:
PDF, 311 KB
english, 2004
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