Modeling and Optimization Techniques for Yield-Aware SRAM...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2014 / 8 Vol. 33; Iss. 8

Modeling and Optimization Techniques for Yield-Aware SRAM Post-Silicon Tuning

Singh, Ashish K., He, Ku, Caramanis, Constantine, Orshansky, Michael
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2014.2317571
Date:
August, 2014
File:
PDF, 1.37 MB
english, 2014
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