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[IEEE Seventh International IEEE Conference on VLSI Multilevel Interconnection - Santa Clara, CA, USA (12-13 June 1990)] Seventh International IEEE Conference on VLSI Multilevel Interconnection - Metal-voiding phenomenon in aluminum and its alloys
Murali, V., Sachdev, S., Banerjee, I., Casey, S., Gargini, P., Welles, C., Smith, L.Year:
1990
Language:
english
DOI:
10.1109/vmic.1990.127855
File:
PDF, 353 KB
english, 1990