[IEEE 2012 IEEE Asian Solid State Circuits Conference (A-SSCC) - Kobe, Japan (2012.11.12-2012.11.14)] 2012 IEEE Asian Solid State Circuits Conference (A-SSCC) - Adaptive program verify scheme for improving NAND flash memory performance and lifespan
Park, Sang In, Shin, Dongkun, Han, Eui GyuYear:
2012
Language:
english
DOI:
10.1109/ipec.2012.6522626
File:
PDF, 393 KB
english, 2012