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[IEEE 2010 International Conference on Advanced Optoelectronics and Lasers (CAOL) - Sevastopol, Ukraine (2010.09.10-2010.09.14)] 2010 International Conference on Advanced Optoelectronics and Lasers - Enhanced interferometric technique for non-destructive characterization of crystalline optical materials: automated express refractive index measurements
Karbovnyk, I. D., Andrushchak, N. A., Bobitskii, Ya.V.Year:
2010
Language:
english
DOI:
10.1109/caol.2010.5634203
File:
PDF, 195 KB
english, 2010