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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Characterization and handling of low-cost micro-architectural signatures in MPSoCs
Krieg, Armin, Grinschgl, Johannes, Steger, Christian, Weiss, Reinhold, Genser, Andreas, Bock, Holger, Haid, JosefYear:
2012
Language:
english
DOI:
10.1109/ets.2012.6233011
File:
PDF, 1011 KB
english, 2012